UltraSurf 4X 300 4-Axis Non-Contact Metrology System

  • Overview

    UltraSurf 4X 300 Overview

    Enhance your optical metrology capabilities with UltraSurf 4X 300, OptiPro’s high precision 4-axis non-contact metrology system. UltraSurf is capable of measuring various rotationally-symmetric precision optical components, including planos, spheres, and aspheres, to sub-micron accuracies. This powerful and precise instrument can perform both surface profiling and low-coherence interferometry to measure optics made from a variety of materials, including glasses, ceramics, crystals, and metals.

    With UltraSurf 4X 300, you can take advantage of the following benefits:

    • High precision measurements: Granite base and air bearing axes allow for a stable foundation and accurate motion 4-axis air bearing system
      • 2 linear, 2 rotary axes
      • X & C axes position the part
      • Z & B axes position the probe
    • Highest quality air bearings and linear motor technology
      • Linear: 25nm resolution
      • Rotary: Sub-arc second resolution
    • Easy setups: Intuitive graphical user interface for simple instrument operation
    • Fast measurements: Aspheric measurement in under a minute
    • Highly productive: Proprietary software and the use of a variety of sensors allow for multiple feature measurements in one setup
      • Capable of measuring the inside and outside surfaces of hemispherical domes, depending on the probe that is utilized. One measurement with the UltraSurf can capture:
        • RoC of S1 and S2
        • Form of R1 and R2
        • Center Thickness
        • Edge Thickness Deviation (Wedge)
      • Innovative software provides comprehensive 3D and 2D contour analysis, surface figure, and surface texture analysis
      • Perform 2D measurement or 3D measurement by creating a 3D topographical map for correction files
    • Infinite asphere capability: Accurately measure ANY asphere up to 300mm in diameter
    • Material flexibility: Capable of measuring a variety of materials, including optical glasses, ceramics, crystals, and metals
    • Ground or polished workpieces: Multiple sensors available at different wavelengths allow for measurement of optics in the ground or polished state
    • Multiple data export formats allow seamless integration with standard optical fabrication platforms.
    • Non-contact metrology significantly reduces the likelihood of workpiece damage during inspection

    With a small footprint to optimize floor space and exceptional ergonomics for maximum operating efficiency, UltraSurf was engineered with the customer in mind. Stay ahead of the technological curve, and your competition, with the UltraSurf non-contact metrology system.

  • Specs

    UltraSurf 4X 300 Technical Specifications

    Vertical Interferometer Specs* PRO Tower 4i/6i
    Working Diameter Range 1-300 mm (0.04"-11.8")
    Objective Size Up to 203.2 mm (8", Custom)
    Resolution of Encoder 0.0001 mm (0.000004")
    Wavefront Measurement Accuracy lambda/20 (dependent on objective accuracy)
    Z-Axis Stage Travel
    6" Zygo Verifier 1,000 mm (39.4")
    4" Zygo Verifier 1,250 mm (49.2")
    Cross Slide Travel
    X-Axis 50.8 mm (2")
    Y-Axis 50.8 mm (2")
    Machine Dimensions
    Width 1,700 mm (66.9")
    Depth 1,600 mm (63")
    Height 2,200 mm (86.6")
    Weight 1,814 kg (4,000 lbs.)

    *Specifications subject to change. Contact OptiPro for the latest specifications.

  • Video