There’s a lot riding on your components. We get it. That’s why you take the accuracy of your measurements so seriously – and why we take the accuracy and intelligence of our equipment so seriously. From contour and surface texture analysis to wavefront and radius measurements, we offer the precision that you require. Planos, spheres, aspheres, hemispheres. Cylinders, ogives, freeform optics. No matter what your requirements, you can trust OptiPro’s measure of confidence.
UltraSurf 4X 300, OptiPro’s high precision 4-axis non-contact metrology system is capable of measuring various rotationally-symmetric precision optical components, including planos, spheres, and aspheres, to sub-micron accuracies.
UltraSurf 5X 400, OptiPro’s high precision 5-axis non-contact metrology system is capable of measuring various precision optical components, from plano optics to spheres, aspheres, cylinders, torics, and freeforms to sub-micron accuracies.
OptiTrace 5000 high precision contact surface profilometer is a unique solution for the measurement of spheres, aspheres, and cylinder precision optics.
The PRO Tower vertical interferometer is capable of measuring the wavefront and radius of optics that are up to 300 mm in diameter.
UltraCURV (Computerized Universal Radius Verifier) is a precision spherometer ideal for measuring radius of curvature and sag height of planos and spherical optics.
ZEISS O-INSPECT multi-sensor measuring machines enable to optimally measure each characteristic – optically or by contact.
Thanks to fully automatic setting of both illumination and focus, measuring errors due to operator influence are eliminated. At the mere push of a button, ZEISS O-SELECT evaluates the characteristics and documents the results.
Starrett Video-based measurement systems combine high-resolution images, powerful intuitive software and precision mechanical platforms to deliver superb accuracy and repeatable measurement results.
Manufactured without compromise, Starrett optical comparators provide time tested, cost effective solutions for non-contact measurement.